| Tweet | |
| S. Komeda, M. Tsunoda, K. Nakasai, and H. Uwano, "Prediction of Residual Defects After Code Review Based on Reviewer Confidence," IEICE TRANSACTIONS on Information and Systems, E106.D(3), pp. 273-276, March 2024. | |
| ID | 232 |
| 分類 | 論文誌 |
| タグ | after code confidence defects prediction residual review reviewer |
| 表題 (title) |
Prediction of Residual Defects After Code Review Based on Reviewer Confidence |
| 表題 (英文) |
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| 著者名 (author) |
Shin Komeda, Masateru Tsunoda, Keitaro Nakasai, Hidetake Uwano |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
IEICE TRANSACTIONS on Information and Systems |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
E106.D |
| 号数 (number) |
3 |
| ページ範囲 (pages) |
273-276 |
| 刊行月 (month) |
3 |
| 出版年 (year) |
2024 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id232,
title = {Prediction of Residual Defects after Code Review Based on Reviewer Confidence},
author = {Shin Komeda and Masateru Tsunoda and Keitaro Nakasai and Hidetake Uwano},
journal = {IEICE TRANSACTIONS on Information and Systems},
volume = {E106.D},
number = {3},
pages = {273-276},
month = {3},
year = {2024},
}
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