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Y. Kamei, H. Sato, A. Monden, S. Kawaguchi, H. Uwano, M. Nagura, K. Matsumoto, and N. Ubayashi, "An Empirical Study of Fault Prediction with Code Clone Metrics," In 6th International Conference on Software Process and Product Measurement (Mensura), pp. 55-61, November 2011. | |
ID | 65 |
分類 | 国際会議 |
タグ | |
表題 (title) |
An Empirical Study of Fault Prediction with Code Clone Metrics |
表題 (英文) |
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著者名 (author) |
Yasutaka Kamei,Hiroki Sato,Akito Monden,Shinji Kawaguchi,Hidetake Uwano,Masataka Nagura,Kenichi Matsumoto,Naoyasu Ubayashi |
英文著者名 (author) |
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編者名 (editor) |
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編者名 (英文) |
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キー (key) |
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書籍・会議録表題 (booktitle) |
6th International Conference on Software Process and Product Measurement (Mensura) |
書籍・会議録表題(英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
55-61 |
組織名 (organization) |
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出版元 (publisher) |
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出版元 (英文) |
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出版社住所 (address) |
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刊行月 (month) |
11 |
出版年 (year) |
2011 |
採択率 (acceptance) |
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URL |
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付加情報 (note) |
Nara, Japan |
注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 71.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@inproceedings{id65, title = {An Empirical Study of Fault Prediction with Code Clone Metrics}, author = {Yasutaka Kamei and Hiroki Sato and Akito Monden and Shinji Kawaguchi and Hidetake Uwano and Masataka Nagura and Kenichi Matsumoto and Naoyasu Ubayashi}, booktitle = {6th International Conference on Software Process and Product Measurement (Mensura)}, pages = {55-61}, month = {11}, year = {2011}, note = {Nara, Japan}, } |