Y. Kamei, H. Sato, A. Monden, S. Kawaguchi, H. Uwano, M. Nagura, K. Matsumoto, and N. Ubayashi, "An Empirical Study of Fault Prediction with Code Clone Metrics," In 6th International Conference on Software Process and Product Measurement (Mensura), pp. 55-61, November 2011.
ID 65
分類 国際会議
タグ
表題 (title) An Empirical Study of Fault Prediction with Code Clone Metrics
表題 (英文)
著者名 (author) Yasutaka Kamei,Hiroki Sato,Akito Monden,Shinji Kawaguchi,Hidetake Uwano,Masataka Nagura,Kenichi Matsumoto,Naoyasu Ubayashi
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
書籍・会議録表題 (booktitle) 6th International Conference on Software Process and Product Measurement (Mensura)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 55-61
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 11
出版年 (year) 2011
採択率 (acceptance)
URL
付加情報 (note) Nara, Japan
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 71.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id65,
         title = {An Empirical Study of Fault Prediction with Code Clone Metrics},
        author = {Yasutaka Kamei and Hiroki Sato and Akito Monden and Shinji Kawaguchi and Hidetake Uwano and Masataka Nagura and Kenichi Matsumoto and Naoyasu Ubayashi},
     booktitle = {6th International Conference on Software Process and Product Measurement (Mensura)},
         pages = {55-61},
         month = {11},
          year = {2011},
          note = {Nara, Japan},
}
  

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